József Gyulai - Selected Publications#

Ions and carbon nanostructures, Gyulai, Jozsef; Tapaszto, Levente; Horvath, Zsolt Endre; et al. RADIATION EFFECTS AND DEFECTS IN SOLIDS 168, 412-417 (2013).

Modification, Synthesis, and Analysis of Advanced Materials Using Ion Beam Techniques, Balogh, Adam Georg; Baba, Koumei; Cohen, David D.; et al. ADVANCES IN MATERIALS SCIENCE AND ENGINEERING, 431297 (2012).

In Situ Spectroscopic Ellipsometry Study of Protein Immobilization on Different Substrates Using Liquid Cells, Nemeth, Andrea; Kozma, Peter; Huelber, Timea; et al. SENSOR LETTERS, 85, 730-735 (2010).

The "EOTVOS" program in space research - 1979-1986, Gyulai, J.; Gyuro, I. Materials Science Forum, 649, 11-16 (2010).

Atomically Resolved STM Images of Carbon Nanotube Defects Produced by Ar+ Irradiation, Z. Osváth, G. Vértesy, L. Tapasztó, F. Wéber, Z. E. Horváth, J. Gyulai, and L. P. Biró, Phys. Rev. B 72, 045429 (2005).

Radiation Damage and Annealing in Ion Implantation (book chapters, 2000, 1996, 1992)

Ion‐induced amorphous and crystalline phase formation in Al/Ni, Al/Pd, and Al/Pt thin films, LS Hung, M Nastasi, J Gyulai, JW Mayer - Applied Physics Letters, 1983, (193 Google Scholar citations)

Kinetics of TiSi2 formation by thin Ti films on Si, L. S. Hung, J. Gyulai, J. W. Mayer, S. S. Lau and M‐A. Nicolet, J. Appl. Phys. 54, 5076 (1983); http://dx.doi.org/10.1063/1.332781 (171 Google Scholar citations)

Improvement of crystalline quality of epitaxial Si layers by ion‐implantation techniques, S. S. Lau, S. Matteson, J. W. Mayer, P. Revesz, J. Gyulai, J. Roth, T. W. Sigmon and T. Cass, Appl. Phys. Lett. 34, 76 (1979); http://dx.doi.org/10.1063/1.90564
(126 Google Scholar citations)


Author of 458 scientific publications, that received 3651 citations according to the record at the Hungarian Academy of Sciences.
He contributed to a major paradigm and technology shift in semiconductor industry, that resulted in a change from orientation 111 to 100 of Si crystals. He is a co-author on 10+ international, technology related patents.